Join us at booth 5 to discuss practical applications of languages, tools, methodologies and standards that can significantly improve your design and verification flows.
Reference: The complete program grid.
9:45 a.m. – 11:15 a.m.
T1.1 – G-QED for pre-silicon verification
Keerthi Devarajegowda
Abstract: https://dvcon-europe.org/program/2024-tutorials#session-2-15
9:45 a.m. – 11:15 a.m.
T2.1 – Hierarchical CDC and RDC closure with standard abstract models
Abdel Ayari, Siemens; Joachim Voges, Infineon Technologies AG; Julian Massicot, STMicroelectronics; Jean-Christophe Brignone, STMicroelectronics, James Gillespie, Synopsys
Abstract: https://dvcon-europe.org/program/2024-tutorials#session-2-3
9:45 a.m. – 11:15 a.m.
T4.1 – A detailed tour of IEEE (Institute of Electrical and Electronics Engineers ) standard P3164
Joerg Bormann, Siemens, and Miltos Grammatikakis
Abstract: https://dvcon-europe.org/program/2024-tutorials#session-2-16
11:30 a.m. – 1 p.m.
T1.2 - "Calling all engines" – faster coverage closure with simulation, formal and emulation
Yassine Eben-Amine
Abstract: https://dvcon-europe.org/program/2024-tutorials#session-2-13
11:30 a.m. – 1 p.m.
T3.2 - Developing complex systems using model-based cybertronic systems engineering methodology
Petri Solanti
Abstract: https://dvcon-europe.org/program/2024-tutorials#session-2-14
10 a.m. – 11 a.m.
Session 1E – A novel approach for hardware/software (HW/SW) co-verification: leveraging PSS (portable stimulus standard) to orchestrate UVM (universal verification methodology) and C tests
Wael Mahmoud, Tom Fitzpatrick, Vishal Baskar, and Mohamed Nafea
11:15 a.m. – noon
Session 2E – Safety analysis of automated driving platforms using digital twin simulation and runtime monitoring
Tasneem A. Awaad, Hanya A. Elged, Mohamed A. Abu-Bakr, Sama Y. Fathy, Sara H. Ahmed, Mohamed Abdelsalam and M. Watheq El-Kharashi
4:15 p.m. - 5:45 p.m.
Session 4A - Trustworthiness evaluation of deep learning accelerators using UVM-based verification with error injection
Randa Aboudeif, Tasneem A. Awaad, Mohamed Abdelsalam and Yehea Ismail
Access the complete list of papers.