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Where today meets tomorrow.
{"heading":"DFT, Operations and
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SIEMENS EDA EXPERIENCE

DFT, Operations and <br />Embedded Analytics

<p>Find out how our customers use advanced DFT and functional monitoring to raise test coverage, improve yield and enhance product quality, security and reliability across the silicon lifecycle.</p>
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{"items":[{"title":"From Test and Functional Debug to Lifecycle Solutions","subtitle":"NETWORKING SESSION","background":"pale-blue","description":"<p>Design for test and functional monitoring are playing a key role in the move to product lifecycle management in the semiconductor industry.\r Join Lee Harrison and Andy Gothard for an interactive session that provides an informal opportunity to network and find out more about some of the key developments driving this change.\r</br>\r</br></p>","button":{"text":"SAVE YOUR SEAT","url":"https://events.sw.siemens.com/en-US/realizelive/agenda?agendaPath=session/544774","type":"Secondary"},"image":"https://images.sw.cdn.siemens.com/siemens-disw-assets/public/1firaSdOhcI6JvMh7MD9DY/en-US/tessent-embedded-sdk-640x360.jpg?w=640&q=60","imageAlt":"Rendering of the globe amid binary code and electronics","imageTitle":"Rendering of the globe amid binary code and electronics","rightIcon":"fal fa-long-arrow-right fa-lg","imageAlign":"image-right"},{"title":"Which are the Best Patterns?","subtitle":"SESSION","background":"pale-blue","description":"<p><i>Which are the Best Patterns? - Critical Area Weighted Pattern Optimization</i></br>Semiconductor companies have demonstrated significant value in using patterns based on defect-oriented fault models. 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NETWORKING SESSION

From Test and Functional Debug to Lifecycle Solutions

<p>Design for test and functional monitoring are playing a key role in the move to product lifecycle management in the semiconductor industry. Join Lee Harrison and Andy Gothard for an interactive session that provides an informal opportunity to network and find out more about some of the key developments driving this change. </br> </br></p>

Rendering of the globe amid binary code and electronics

SESSION

Which are the Best Patterns?

<p><i>Which are the Best Patterns? - Critical Area Weighted Pattern Optimization</i></br>Semiconductor companies have demonstrated significant value in using patterns based on defect-oriented fault models. It is apparent that new patterns are necessary to meet DPM goals... </p><p></p>

WHITE PAPER

Tessent Silicon Lifecycle Solutions

<p>The time is right to implement product lifecycle management practices in the semiconductor industry, which Siemens calls Silicon Lifecycle Solutions (SLS). This paper explains the drivers and benefits, and describes the elements of the Tessent™ SLS platform.</p>

Stylized ICs | Tessent IC test solutions

WHITE PAPER

Streaming Scan Network: A No-Compromise Approach to DFT

<p>Streaming Scan Network (SSN) technology is the latest addition to the industry-leading Tessent DFT portfolio. It eliminates the difficult and costly trade-offs between test implementation effort and manufacturing test cost, enabling a true bottom-up DFT flow.</p>

Illustration of the bus-based architecture of Tessent Streaming Scan Network

EDA INSIGHTS WITH JOE SAWICKI

Silicon to Systems: from Vision to Reality

<p>Semiconductor innovation is fueling digitalization as SoCs become ever more complex hardware and software systems. To thrive requires a visionary approach, in a semiconductor industry primed to surpass a trillion dollars in revenue by 2030. Joe Sawicki, EVP IC, Siemens EDA, shares how three tenets of technology, design, and system scaling, on a foundation of AI, help you engineer a smarter future faster.</br></br> </p>

PORTFOLIO

Xcelerator – Embrace the Digital Future

<p>Our comprehensive and integrated portfolio of software and services for electronic and mechanical design, system simulation, manufacturing, operations and lifecycle analytics.</p>

Xcelerator